Item added to cart

Free

Shipping
25% Off
ShopSpell

Angewandte Oberflchenanalyse mit SIMS Sekundr-Ionen-Massenspektrometrie AES Au [Paperback]

$59.99     $79.99    25% Off      (Free Shipping)
100 available
  • Category: Books (Science)
  • Author:  Grasserbauer, M., Dudek, H.J., Ebel, Maria F.
  • Author:  Grasserbauer, M., Dudek, H.J., Ebel, Maria F.
  • ISBN-10:  3642701787
  • ISBN-10:  3642701787
  • ISBN-13:  9783642701788
  • ISBN-13:  9783642701788
  • Publisher:  Springer
  • Publisher:  Springer
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Mar-2011
  • Pub Date:  01-Mar-2011
  • SKU:  3642701787-11-SPRI
  • SKU:  3642701787-11-SPRI
  • Item ID: 105222645
  • List Price: $79.99
  • Seller: ShopSpell
  • Ships in: 5 business days
  • Transit time: Up to 5 business days
  • Delivery by: Jul 17 to Jul 19
  • Notes: Brand New Book. Order Now.
Add Review

 

 

 

 

Copyright © 2018 - 2026 ShopSpell