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Electromigration in Thin Films and Electronic Devices: Materials and Reliability [Paperback]

Name: Electromigration in Thin Films and Electronic Devices: Materials and Reliability [Paperback]
Brand: Woodhead Publishing
SKU: 105851782
Price: 280.99 USD
Availability: InStock
Author: Kim, Choong-Un

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Category: Books (Technology & Engineering)
Author: Kim, Choong-Un
Author: Kim, Choong-Un
ISBN-10: 0081016964
ISBN-10: 0081016964
ISBN-13: 9780081016961
ISBN-13: 9780081016961
Publisher: Woodhead Publishing
Publisher: Woodhead Publishing
Pages: 360
Pages: 360
Binding: Paperback
Binding: Paperback
Pub Date: 01-Jun-2016
Pub Date: 01-Jun-2016
SKU: 0081016964-11-MPOD
SKU: 0081016964-11-MPOD
Item ID: 105851782

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Delivery by: Oct 13 to Oct 15
Notes: Brand New Item. Not shipped to AK, HI, APO, FPO, AE.