ShopSpell

Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists [Paperback]

$80.99       (Free Shipping)
82 available
  • Category: Books (Science)
  • Author:  ZhiLi, Dong
  • Author:  ZhiLi, Dong
  • ISBN-10:  1032246804
  • ISBN-10:  1032246804
  • ISBN-13:  9781032246802
  • ISBN-13:  9781032246802
  • Publisher:  CRC Press
  • Publisher:  CRC Press
  • Pages:  272
  • Pages:  272
  • Binding:  Paperback
  • Binding:  Paperback
  • SKU:  1032246804-11-MPOD
  • SKU:  1032246804-11-MPOD
  • Item ID: 107085384
  • Seller: ShopSpell
  • Ships in: 2 business days
  • Transit time: Up to 5 business days
  • Delivery by: Sep 29 to Oct 01
  • Notes: Brand New Book. Order Now.
The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics.Part I: Introduction to Crystallography 1. Periodicity of Crystals and Bravais Lattices 2. Symmetry of Crystals, Point Groups and Space Groups 3. Reciprocal Lattice 4. Examples for Crystal Structure Representation Part Ii: X-ray Diffraction of Materials 5. Geometry of X-ray Diffraction 6. Intensity of Diffracted X-ray Beam 7. Experimental Methods and Powder X-ray Diffractometer 8. Rietveld Refinement of Powder X-ray Diffraction Patterns Part Iii: Transmission Electron Microscopy of Materials 9. Atomic Scattering Factors for Electrons and X-rays 10. Electron Diffraction in Transmission Electron Microscope 11. Diffraction Contrast 12. Phase Contrast

The structureproperty relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.

  • Introduces fundamentals of crystallography
  • Covers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methods
  • Describes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrasts
  • Discusses applications of HRTEM in materials research
  • Explains concepts used in XRD and TEM lab training