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Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping [Hardcover]

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  • Category: Books (Science)
  • Author:  Engler, Olaf, Zaefferer, Stefan, Randle, Valerie
  • Author:  Engler, Olaf, Zaefferer, Stefan, Randle, Valerie
  • ISBN-10:  1032192488
  • ISBN-10:  1032192488
  • ISBN-13:  9781032192482
  • ISBN-13:  9781032192482
  • Publisher:  CRC Press
  • Publisher:  CRC Press
  • Pages:  580
  • Pages:  580
  • Binding:  Hardcover
  • Binding:  Hardcover
  • SKU:  1032192488-11-MPOD
  • SKU:  1032192488-11-MPOD
  • Item ID: 107090606
  • Seller: ShopSpell
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  • Delivery by: Sep 28 to Sep 30
  • Notes: Brand New Book. Order Now.

Reflecting emerging methods and the evolution of the field,?Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation?keeps mathematics to a minimum in covering both traditional macrotexture analysis and more advanced electron-microscopy-based microtexture analysis.?

Part I: Fundamental Issues. 1. Introduction. 2. Descriptors of Orientation. 3. Application of Diffraction to Texture Analysis. Part II: Macrotexture Analysis. 4. Macrotexture Measurements. 5. Evaluation and Representation of Macrotexture Data. Part III: Microtexture Analysis. 6. Diffraction Techniques in TEM and SEM. 7. Procedures for Orientation Determination from Electron Diffraction Patterns. 8. Practice of Orientation Measurement and Orientation Microscopy. 9. Orientation Microscopy and Orientation Mapping. 10. Evaluation and Representation of Microtexture Data. 11. Crystallographic Analysis of Interfaces, Surfaces, and Connectivity. 12. Orientation Relationships between Phases and Texture Formation during Phase Transformations. 13. Synchrotron Radiation, Nondiffraction Techniques, and Comparisons between Methods. Appendices.

Reflecting emerging methods and the evolution of the field, Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping keeps mathematics to a minimum in covering both traditional macrotexture analysis and more advanced electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. Thoroughly updated, this Third Edition of a best-seller is a rare introductory-level guide to texture analysis.

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