Advances in Imaging and Electron Physics [Hardcover]

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contributions from leading authorities
• Informs and updates on all the latest developments in the field

1. Pattern Generators for Reflective Electron-Beam Lithography (REBL)
   Allen M. Carroll
2. Recent Developments in Time-of-Flight Mass Spectrometry
   Frank Gunzer and J?rgen Grotemeyer
3. A Special Voice Transform, Analytic Wavelets, and Zernike Functions
   Margit Pap
4. The Hankel Transform in n-dimensions and Its Applications in Optical Propagation and Imaging
   Colin Sheppard
   

Features cutting-edge articles on recent developments in all areas of microscopy, image science and many related subjects in electron physics

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse andl#Œ