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Energy-Efficient Fault-Tolerant Systems [Paperback]

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  • Category: Books (Science)
  • ISBN-10:  1493945513
  • ISBN-10:  1493945513
  • ISBN-13:  9781493945511
  • ISBN-13:  9781493945511
  • Publisher:  Springer
  • Publisher:  Springer
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Apr-2016
  • Pub Date:  01-Apr-2016
  • SKU:  1493945513-11-SPRI
  • SKU:  1493945513-11-SPRI
  • Pages:  335
  • Pages:  335
  • Item ID: 100769753
  • List Price: $169.99
  • Seller: ShopSpell
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This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.Evolution of Fault Tolerant Design.- Fault and Reliability Models.- Energy Efficient Design Techniques.- Error Correction Coding.- System-level Reliable Design.- Fault Tolerant.- Finite Field Arithmetic Circuit? Design and? Testing? Techniques.- Reliable Network-on-Chip Architectures.- Energy Efficient Reconfigurable Systems.- Bio-Inspired Online Fault Detection in NoC Interconnect.- Fault-tolerant dynamically reconfigurable NoC-based SoC.

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems.? It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches.? Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

????????? Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability;

????????? Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches;

????????? Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.

Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability Covers the entire product lifecycle ols(
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