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Fatigue Testing and Analysis Theory and Practice [Hardcover]

$166.99       (Free Shipping)
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  • Category: Books (Technology & Engineering)
  • Author:  Yung-Li Lee, Jwo Pan, Richard Hathaway, Mark Barkey
  • Author:  Yung-Li Lee, Jwo Pan, Richard Hathaway, Mark Barkey
  • ISBN-10:  0750677198
  • ISBN-10:  0750677198
  • ISBN-13:  9780750677196
  • ISBN-13:  9780750677196
  • Publisher:  Butterworth-Heinemann
  • Publisher:  Butterworth-Heinemann
  • Pages:  416
  • Pages:  416
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Jun-2004
  • Pub Date:  01-Jun-2004
  • SKU:  0750677198-11-MPOD
  • SKU:  0750677198-11-MPOD
  • Item ID: 100777644
  • Seller: ShopSpell
  • Ships in: 2 business days
  • Transit time: Up to 5 business days
  • Delivery by: Jan 18 to Jan 20
  • Notes: Brand New Book. Order Now.
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