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Introduction To Focused Ion Beam Nanometrology [Paperback]

$105.99       (Free Shipping)
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  • Category: Books (Technology & Engineering)
  • Author:  David C. Cox
  • Author:  David C. Cox
  • ISBN-10:  1681740206
  • ISBN-10:  1681740206
  • ISBN-13:  9781681740201
  • ISBN-13:  9781681740201
  • Publisher:  Morgan & Claypool Publishers
  • Publisher:  Morgan & Claypool Publishers
  • Pages:  84
  • Pages:  84
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Jun-2015
  • Pub Date:  01-Jun-2015
  • SKU:  1681740206-11-MPOD
  • SKU:  1681740206-11-MPOD
  • Item ID: 100809461
  • Seller: ShopSpell
  • Ships in: 2 business days
  • Transit time: Up to 5 business days
  • Delivery by: Jan 20 to Jan 22
  • Notes: Brand New Book. Order Now.
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
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