In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
Application Example 1: Lateral Resolution of in-Lens SE and High-Angle BSE Imaging at Low Accelerating Voltages, Below 2.0 kV.- Application Example 2: Z-Contrast Sensitivity in Low-Voltage, High-Angle BSE Imaging.- Application Example 3: Information Depth in Low-Voltage, High-Angle BSE Imaging.- Application Example 4: Nano Inclusions in Co-Hardened Gold Plating for Electronic Applications #x2013; Further Evidence for High Lateral Resolution in Low-Voltage, High-Angle BSE Imaging.- Application Example 5: A Thin Layer of Organic Contaminant on the Surface of Mirror-Polished Al-Based Hard Disks.- Application Example 6: A Further Potential of Ultralow-Voltage In-lens SE Imaging.- Application Example 7: Sample Surface Preparation by Ultramicrotomy Using a Diamond Knife for Cross-Sectional Examination of Various Coatings on Metals.- Application Example 8: Cross-Sectional Examination of a Galvanized Steel.- Application Example 9: Cross-Sectional Examination of a Painted Steel.- Application Example 10: Cross-Sectional Examination of Solder Joint of the Printed Circuit Board.- Application Example 11: Cross-Sectional Examination of a Tin-Plated Copper Sheet for Electronic Application.- Application Example 12: Cross-Sectional Examination of an Anodized Aluminum Alloy for Aerospace Application.- Application Example 13: Cross-Sectional Examination of a Porous Anodic Oxide Film Grown on a Heterogeneous Al-Fe Alloy.- Application Example 14: Corrosion of an Al 2024-T3 Alloy for Aerospace Application.- Application Example 15: Cross-Secl“L