Circadian Rhythms for Future Resilient Electronic Systems: Accelerated Active Self-Healing for Integrated Circuits [Paperback]

This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level.  The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery.  Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models.  

• Presents novel techniques, tested with experiments on real hardware;
• Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;
• Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;
• Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;
• Includes coverage of resilient aspects of emerging applications such as IoT.

Introduction to Wearout.- Accelerated Self-Healing Techniques for BTI Wearout.- Accelerating and Activating Recovery for EM Wearout.- Circuit Techniques for Accelerated and Active Recovery.- Accelerated Self-Healing as a Key Design Knob for Cross-Layer Resilience.- Design and Aging Challenges in FinFET Circuits and Internet of Things (IoT) Applications.- Future Directions in Self-Healing.

Xinfei Guo is a Design Engineer in Semiconductor industry in US. He received his Ph.D. degree in Computer Engineering from the University of Virginia in May 2018. He also held a M.S. degree in Electrical and Computer Engineering from the University of Florida, GlC}