X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons [Paperback]

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.1 Overall Description of Imperfect Lamellar Crystals.- 1.1 Some Reminders on the Specific Characteristics of Crystals with a Triperiodic Structure.- 1.2 Range of Validity of the Direct Methods of Structural Analysis.- 1.3 Indirect Structural Analysis of Partially Disordered Lamellar Systems. Principles of Their Modelization.- 1.4 Determination of the Structural Characteristics of the Layers.- 1.5 General Characteristics of Triperiodic Layer Stackings.- 1.6 Principal Characteristics of Lamellar Structures with Stacking Faults.- 1.7 Principal Characteristics of Interstratified Minerals.- 1.8 Commensurate and Incommensurate Structures in Interstratified Systems.- References.- 2 Theory of the Diffraction Phenomenon Produced by Powders of Microcrystals with a Lamellar Structure.- 2.1 Diffraction from an Isolated Layer of Finite Extent.- 2.2 Diffraction from a Defect-Free Stack of Identical Layers.- 2.3 Diffraction by a Powder of Particles with Totally Random Orientation.- 2.4 Diffraction from a Powder of Partially Oriented Particles.- References.- 3 Diffraction from Lamellar Crystals with Stacking Faults.- 3.1 General Expression for the Diffraction Produced by Stacks of Layers with Position Defects.- 3.2 Diffraction Produced by Stacks Containing Rotation or Translation Faults Without Mutual Interaction.- 3.3 Diffraction Produced by Stacks with Defects Due to Fluctuations in the Positions of the Layers.- References.- 4 Statistical Models and Parameters Used to Describe Interstratified Lamellar Systems.- 4.1 General Parameters Characteril#,