Contents
Foreword
Preface
Acknowledgements
Author Bio
Chapter 1: An Overview of ICP Mass Spectrometry
Chapter 2: Principles of Ion Formation
Chapter 3: Sample Introduction
Chapter 4: Plasma Source
Chapter 5: Interface Region
Chapter 6: Ion Focusing System
Chapter 7: Mass Analyzers: Quadrupole Technology
Chapter 8: Mass Analyzers: Double-Focusing Magnetic Sector Technology
Chapter 9: Mass Analyzers: Time-Of-Flight Technology
Chapter 10: Mass Analyzers: Collision/Reaction Cell and Interface Technology
Chapter 11: Ion Detection
Chapter 12: Peak Measurement Protocol
Chapter 13: Methods of Quantitation
Chapter 14: Review of Interferences
Chapter 15: Routine Maintenance
Chapter 16: Sampling and Sample Preparation Procedures
Chapter 17: Reducing Errors from Contamination
Chapter 18: Alternative Sampling Accessories
Chapter 19: Trace Element Speciation Techniques
Chapter 20: The ICP-MS Application Landscape
Chapter 21: Fundamental Principles and Applications of Atomic Absorption/Fluorescence
Chapter 22: Fundamental Principles and Applications of ICP Optical Emission Spectrometry
Chapter 23: Fundamental Principles of Applications of Other Atomic Spectroscopic Techniques
- X Ray Analytical Techniques (XRF/XRD)
- Microwave Induced Plasma Atomic Emission Spectrometry (MIP-AES)
- Laser Induced Breakdown Spectrometry (LIBS)
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