Properties of Crystalline Materials by X-ray Diffraction Methods and Symmetry Groups: A Practical Approach [Hardcover]

This book is a fundamental work for those seeking to understand the structure and properties of crystalline materials from a rigorous and systematic approach. Its coverage, which ranges from the physical principles of X-rays to structural refinement using the Rietveld method, provides a solid theoretical and practical foundation. The inclusion of symmetry group analysis and the study of elasticity reinforce its value in areas such as electronics and engineering. With an educational and precise approach, this work becomes an indispensable reference for materials characterization.

Introduction. Physical foundations of X-rays. Symmetry groups  Crystallography. Introduction to Tensor analysis. Introduction to Elasticity theory. Fundamentals of Rietveld Refinement. X-ray diffraction applications. A practical exercise using PANalytical XPert HighScore. Material properties from the symmetry group.

This book provides a structure and properties of crystalline materials from a rigorous and systematic approach. From physical principles of X-rays to structural refinement using the Rietveld method, it provides a solid theoretical and practical foundation. This book is a reference for materials characterization.

John Fernando Zapata Mesa has a B.Sc. in theoretical physics, an M.Sc. in elementary particle physics, and a Ph.D. in materials engineering. He completed his postdoctoral stay in quantum mechanics, addressing the problem of quantum confinement in semiconductor heterostructures. He obtained all degrees at the University of Antioquia, Medell?n, Colombia. He has been working at the University of Envigado for 17 years and is a full professor attached to the Faculty of Engineering.

His most recent research deals with the characterization of cementitious materials, the study of confinement in semiconductor heterostructures, and the modeling and simulation of physical phenomena lã‰