Reliability Physics and Engineering provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included?at the end of?each chapter are exercise problems?and answers. Reliability Physics and Engineering is a useful resource for students, engineers, and materials scientists.This book provides critically important information for designing and building reliable cost-effective products. It includes numerous example problems with solutions.1 Introduction2 Materials and Device Degradation2.1 Material/Device Parameter Degradation Modeling2.1.1 Material/Device Parameter Decreases With Time2.1.2 Material/Device Parameter Increases With Time2.2 General Time-Dependent Degradation Models2.3 Degradation Rate Modeling2.4 Delays in the Start of Degradation2.5 Competing Degradation Mechanisms3 From Material/Device Degradation to Time-To-Failure3.1 Time-To-Failure3.2 Time-To-Failure Kinetics4 Time-To-Failure Modeling4.1 Flux-Divergence Impact on Time-To-Failure4.2 Stress Dependence and Activation Energy4.3 Conservative Time-To-Failure Models4.4 Time-To-Failure Modeling Under High StressReferences5 Gaussian Statistics An Overview5.1 Normal Distribution5.2 Probability Density Function5.3 Statistical Process ControlReferences6 Time-To-Failure Statistics6.1 Lognormal Probability Density Function6.2 Weibull Probability Density Function6.3 Multimodal Distributions6.3.1 Multimodal Distribution (Separated In Time)6.3.2 Mixed Multiple Failure MechanismsReferences7 Failure Rate Modeling7.1 Device Failure Rate7.2 Average Failure Rate7.2.1 Lognormal Average Failure Rate7.2.2 Weibull Average Failure Rate7.3 Instantaneous Failure Rate7.3.1 Lognormal Instantaneous Failure Rate7.3.2 Weibull Instantaneous Failure Rate7.4 Bathtub Curve7.5 Failure Rate for Electronic DevicesReferences8 Accelerated Degradation8.1 Metastable States8.2 Impact of Temperature on Degradation Rate8.3 Free-Energylc›