This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects.- Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults.- Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm.- Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm.- Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization.- Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model.- Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits.
Dr. S. Jayanthy is a Professor at the Department of Electronics and Communication Engineering, Sri Ramakrishna Engineering College, Coimbatore, India. She received her Masters and PhD from PSG College of Technology and Anna University, Chennai respectively. Prof. Jayanthys research interests are in VLSI Design & Testing, Genetic Algorithms and Embedded Systems. With more than 20 years of teaching experience, she has published 2 chapters and more than 40 resel3'
![Test Generation of Crosstalk Delay Faults in VLSI Circuits [Paperback]](/itemImage/2/9/2/0/2_4036524.jpg "Test Generation of Crosstalk Delay Faults in VLSI Circuits [Paperback]")