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Test Pattern Generation using Boolean Proof Engines [Paperback]

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  • Category: Books (Technology & Engineering)
  • Author:  Drechsler, Rolf, Eggersgl}}}}, Stephan, Fey, G}}rschwin, Tille, Daniel
  • Author:  Drechsler, Rolf, Eggersgl}}}}, Stephan, Fey, G}}rschwin, Tille, Daniel
  • ISBN-10:  9048184916
  • ISBN-10:  9048184916
  • ISBN-13:  9789048184910
  • ISBN-13:  9789048184910
  • Publisher:  Springer
  • Publisher:  Springer
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Mar-2010
  • Pub Date:  01-Mar-2010
  • Item ID: 100994000
  • List Price: $129.99
  • Seller: ShopSpell
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  • Delivery by: Jul 28 to Jul 30
  • Notes: Brand New Book. Order Now.

In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.

Providing an introduction to ATPG, this book reviews the basic concept and classical ATPG algorithms. It is the first book to give a detailed overview on SAT-based ATPG. It describes the state-of-the-art in the field and shows directions for future work.

In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.

1 Introduction. 2 Preliminaries. 2.1 Circuits. 2.2 Fault Models. 2.3 Simple ATPG Framework. 2.4 Classical ATPG Algorithms. 2.5 Benchmarking. 3 Boolean SatisfiabilitylS¨

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