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X-ray Phase-Contrast Imaging Using Near-Field Speckles [Paperback]

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  • Category: Books (Science)
  • Author:  Zdora, Marie-Christine
  • Author:  Zdora, Marie-Christine
  • ISBN-10:  3030663310
  • ISBN-10:  3030663310
  • ISBN-13:  9783030663315
  • ISBN-13:  9783030663315
  • Publisher:  Springer
  • Publisher:  Springer
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Apr-2022
  • Pub Date:  01-Apr-2022
  • SKU:  3030663310-11-SPRI
  • SKU:  3030663310-11-SPRI
  • Pages:  337
  • Pages:  337
  • Item ID: 105124244
  • List Price: $109.99
  • Seller: ShopSpell
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This thesis presents research on novel X-ray imaging methods that improve the study of specimens with small density differences, revealing their inner structure and density distribution. Exploiting the phase shift of X-rays in a material can significantly increase the image contrast compared to conventional absorption imaging. This thesis provides a practical guide to X-ray phase-contrast imaging with a strong focus on X-ray speckle-based imaging, the most recently developed phase-sensitive method. X-ray speckle-based imaging only requires a piece of abrasive paper in addition to the standard X-ray imaging setup. Its simplicity and robustness combined with the compatibility with laboratory X-ray sources, make it an ideal candidate for wide user uptake in a range of fields. An in-depth overview of the state of the art of X-ray speckle-based imaging and its latest developments is given in this thesis. It, furthermore, explores a broad range of applications, from X-ray optics characterisation, to biomedical imaging for 3D virtual histology and geological studies of volcanic rocks, demonstrating is promising potential. Moreover, the speckle-based technique is placed in the context of other phase-sensitive X-ray imaging methods to assist in the choice of a suitable method, hence serving as a guide and reference work for future users.Introduction.- Principles of X-Ray Imaging.- Synchrotron Beamlines, Instrumentation and Contributions.- X-ray Single-Grating Interferometry.- Principles and State of the Art Of X-Ray Speckle-Based Imaging.- The Unified Modulated Pattern Analysis.- At-Wavelength Optics Characterisation Via X-Ray Speckle- And Grating-Based Unified Modulated Pattern Analysis.- 3d Virtual Histology Using X-Ray Speckle With The Unified Modulated Pattern Analysis.- Recent Developments and Ongoing Work In X-Ray Speckle-Based Imaging.- Summary, Conclusions and Outlook.- Appendices.

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