Advances in Imaging and Electron Physics Optics of Charged Particle Analyzers [Hardcover]

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians1. Charged particles in electromagnetic fields

2. Language of aberration expansions in charged particle optics

3. Transporting charged particle beams in static fields

4. Transporting charged particles in radiofrequency fields

5. Static magnetic charged particle analyzers

6. Electrostatic energy analyzers

7. Mass analyzers with combined electrostatic and magnetic fields

8. Time-of-flight mass analyzers

9. Radiofrequency mass analyzers

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articlels’