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Advances in X-Ray Analysis Volume 28 [Paperback]

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  • Category: Books (Science)
  • ISBN-10:  1461294991
  • ISBN-10:  1461294991
  • ISBN-13:  9781461294993
  • ISBN-13:  9781461294993
  • Publisher:  Springer
  • Publisher:  Springer
  • Pages:  408
  • Pages:  408
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Mar-2011
  • Pub Date:  01-Mar-2011
  • SKU:  1461294991-11-SPRI
  • SKU:  1461294991-11-SPRI
  • Item ID: 100712101
  • List Price: $54.99
  • Seller: ShopSpell
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  • Delivery by: Jul 04 to Jul 06
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The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer? ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura? tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom? etry plays in the arsenal of analytical methods found in modern labora? tories. Total reflectance X-ray spectrometry takes advantage of con? sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer? ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented lãF
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