Analytical Transmission Electron Microscopy An Introduction for Operators [Paperback]

This work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hints for the practical work are the focal points.

This practically- oriented textbook represents a clear and comprehensible introduction for all persons who want to use a transmission electron microscope in practice but who are not specially qualified electron microscopists up to now.

1. Why such an effort?.- The problem with the magnification.- The limitation of resolution.- Electron waves.- The role of magnification.- 2. What should we know about electron optics and the construction of an electron microscope.- The principle of multistage imaging.- Rotational-symmetric magnetic fields as electron lenses.- Lens aberrations.- Resolution limit considering the spherical aberration.- Electron gun.- Richtstrahlwert (brightness).- We construct an electron microscope.- Illumination system.- Imaging system.- Specimen stage.- Acquiring the images.- Vacuum system.- Miscellaneous.- We prepare electron-transparent samples.- What is the challenge?.- Classical methods.- Cutting, grinding, and ion milling.- Focused Ion Beam (FIB) techniques.- 4. Let us start with practical microscopy.- What do we peripherally need?.- We put the specimen into the holder and insert it into the microscope.- We check the (alignment) state of the microscope.- Focussing the image  sharpness and contrast.- Contamination and sample damaging.- 5. Let us switch to electron diffraction.- Why diffraction reflexes?.lÓ3