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Digital Memory and Storage [Paperback]

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  • Category: Books (Computers)
  • Author:  Proebster, Walter E.
  • Author:  Proebster, Walter E.
  • ISBN-10:  352808409X
  • ISBN-10:  352808409X
  • ISBN-13:  9783528084097
  • ISBN-13:  9783528084097
  • Publisher:  Vieweg+Teubner Verlag
  • Publisher:  Vieweg+Teubner Verlag
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Jan-1978
  • Pub Date:  01-Jan-1978
  • SKU:  352808409X-11-SPRI
  • SKU:  352808409X-11-SPRI
  • Item ID: 100759312
  • List Price: $69.99
  • Seller: ShopSpell
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  • Delivery by: Jul 04 to Jul 06
  • Notes: Brand New Book. Order Now.
Keynote Address.- On the Development of Digital Memories.- Electromagnetic Storage.- Magnetic Data Recording.- Electromechanical Mass Storage Units  Disk Files.- Electromagnetic Mass Storages  Normal Tape Devices 53.- Tape Libraries with Automatic Reel Transport.- Semiconductor Memories.- Fabrication Technology and Physical Fundamentals of Components Used for Semiconductor Memories.- LSI Semiconductor Memories.- A High Performance Low Power 2048-Bit Memory Chip in MOSFET Technology and Its Application.- Readout Methods and Readout Circuits for Dynamik Charge-Storage Elements.- Monolithic Memories.- Structure, Organization and Applications of CCD Memories.- BEAMOS  Technology and Applications.- Read-Only Memories.- Read-Only Memories with Magnetic Components or with Integrated Semiconductor Circuits.- Electrically Alterable MOS-ROMs, with Particular Emphasis on the Floating Gate Type.- Magnetic Bubble Memories.- Physical Principles of Magnetic Bubble Domain Memory Devices.- Application of the Josephson Effect for Digital Storage.- Ferromagnetic Domain Memories.- Low Temperature Memories.- Application of the Josephson Effect for Digital.- Optical Memories.- Materials for Optical Data Stores.- Optical Memory Systems.- Reliability.- Effects of Defects on Yield, Integration, Cost and Reliability of Large Scale Integrated Semiconductor Memories.  A Tutorial Review.- Reliability of Semiconductor Memories from a Practical Point of View.- Application of Partially Defective Semiconductor Memory Devices in Memory Systems.- Memory / Storage Systems.- Access Methods and Associative Memories.- Increased Chip Capacity and Extended Logical Complexity of LSI-Associative Memories.- Storage Hierarchy Technology and Organization.- The Performance of Small Cache Memories in Minicomputer Systems with Several Processors.- Summary of Abstracts.- The Autors, the Editor.Springer Book Archives
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