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Electron Energy-Loss Spectroscopy in the Electron Microscope [Hardcover]

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  • Category: Books (Technology & Engineering)
  • Author:  Egerton, R.F.
  • Author:  Egerton, R.F.
  • ISBN-10:  144199582X
  • ISBN-10:  144199582X
  • ISBN-13:  9781441995827
  • ISBN-13:  9781441995827
  • Publisher:  Springer
  • Publisher:  Springer
  • Pages:  504
  • Pages:  504
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Apr-2011
  • Pub Date:  01-Apr-2011
  • SKU:  144199582X-11-SPRI
  • SKU:  144199582X-11-SPRI
  • Item ID: 100766703
  • List Price: $379.99
  • Seller: ShopSpell
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Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. ?In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.

This standard guide to electron energy-loss spectroscopy covers instrumentation, physics, procedures and results. The 3rd edition adds new equipment, advances in electron-scattering theory, spectral and image processing, and new applications in nanotechnology.

Chapter 1. An Introduction to EELS
1.1. Interaction of Fast Electrons with a Solid??????????
1.2. The Electron Energy-Loss Spectrum??????
1.3. The Development of Experimental Techniques?? ???????????
1.3.1. Energy-Selecting (Energy-Filtering) Electron Microscopes????
1.3.2. Spectrometers as Attachments to Electron Microscopes?????????
1.4. Alternative Analytical Methods?
1.4.1. Ion-Beam Methods??????
1.4.2. Incident Photons??????????
1.4.3. Electron-Beam Techniques??????
1.5. Comparison of EELS and EDX Spectroscopy???
1.5.1. Detection Limits and Spatial ResolS8

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