Electrothermal Analysis of VLSI Systems [Paperback]

This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.

Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems.
Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration).
Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis.
Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.List of Figures. List of Tables. Preface. Acknowledgments. Part I: The Building Blocks. 1. Introduction. 2. Power Analysis for CMOS Circuits. 3. Temperature-Dependent MOS Device Modeling. 4. Thermal Simulation for VLSI Systems. 5. Fast-Timing Electrothermal Simulation. Part II: The Applications. 6. Temperature-Dependent Electromigration Reliability. 7. Temperature-Driven Cell Placement. 8. Temperature Driven Power and Timing Analysis. Index.From the Foreword:

`Continuing increases in the levels of circuit integration and concomitant increases in performance are sustaining the trend of increasing power lC™