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Emerging Nanotechnologies Test, Defect Tolerance, and Reliability [Hardcover]

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  • Category: Books (Technology & Engineering)
  • ISBN-10:  038774746X
  • ISBN-10:  038774746X
  • ISBN-13:  9780387747460
  • ISBN-13:  9780387747460
  • Publisher:  Springer
  • Publisher:  Springer
  • Pages:  408
  • Pages:  408
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Feb-2007
  • Pub Date:  01-Feb-2007
  • SKU:  038774746X-11-SPRI
  • SKU:  038774746X-11-SPRI
  • Item ID: 100768070
  • List Price: $169.99
  • Seller: ShopSpell
  • Ships in: 5 business days
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  • Delivery by: Jan 23 to Jan 25
  • Notes: Brand New Book. Order Now.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

An account of strengths and disadvantages of new technologies, including chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata, nanowires and carbon nanotubes. The book offers a single source of reference in a rapidly changing field.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.