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From Contamination to Defects, Faults and Yield Loss Simulation and Application [Paperback]

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  • Category: Books (Computers)
  • Author:  Khare, Jitendra B., Maly, Wojciech
  • Author:  Khare, Jitendra B., Maly, Wojciech
  • ISBN-10:  146128595X
  • ISBN-10:  146128595X
  • ISBN-13:  9781461285953
  • ISBN-13:  9781461285953
  • Publisher:  Springer
  • Publisher:  Springer
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Feb-2011
  • Pub Date:  01-Feb-2011
  • SKU:  146128595X-11-SPRI
  • SKU:  146128595X-11-SPRI
  • Item ID: 105253894
  • List Price: $109.99
  • Seller: ShopSpell
  • Ships in: 5 business days
  • Transit time: Up to 5 business days
  • Delivery by: Jul 09 to Jul 11
  • Notes: Brand New Book. Order Now.
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