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Handbook of Practical X-Ray Fluorescence Analysis [Hardcover]

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  • Category: Books (Technology & Engineering)
  • ISBN-10:  3540286039
  • ISBN-10:  3540286039
  • ISBN-13:  9783540286035
  • ISBN-13:  9783540286035
  • Publisher:  Springer
  • Publisher:  Springer
  • Pages:  845
  • Pages:  845
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Feb-2006
  • Pub Date:  01-Feb-2006
  • SKU:  3540286039-11-SPRI
  • SKU:  3540286039-11-SPRI
  • Item ID: 100794368
  • List Price: $699.99
  • Seller: ShopSpell
  • Ships in: 5 business days
  • Transit time: Up to 5 business days
  • Delivery by: Jul 04 to Jul 06
  • Notes: Brand New Book. Order Now.
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even special“'
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