ShopSpell

Handbook of X-Ray Analysis of Polycrystalline Materials [Paperback]

$44.99     $54.99    18% Off      (Free Shipping)
100 available
  • Category: Books (Science)
  • Author:  Mirkin, Lev. I.
  • Author:  Mirkin, Lev. I.
  • ISBN-10:  1468460625
  • ISBN-10:  1468460625
  • ISBN-13:  9781468460629
  • ISBN-13:  9781468460629
  • Publisher:  Springer
  • Publisher:  Springer
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Mar-2012
  • Pub Date:  01-Mar-2012
  • SKU:  1468460625-11-SPRI
  • SKU:  1468460625-11-SPRI
  • Item ID: 100794716
  • List Price: $54.99
  • Seller: ShopSpell
  • Ships in: 5 business days
  • Transit time: Up to 5 business days
  • Delivery by: Jul 07 to Jul 09
  • Notes: Brand New Book. Order Now.
The book is best used in the following sequence. (1) The radiation and method of recording are selected in accordance with the data of Chapters 1 and 2; the detailed param? eters for the recording are defined. (2) The patterns are indexed with the assistance of the graphs and tables of Chapter 3. (3) The measured intensities are compared with the values found from the tables of Chapter 4. (4) The particular problem at hand (determi? nation of stresses, phase analysis, and so on) is solved with the aid of the tables and nomo? grams given in the second part of the book. The nomograms can be enlarged for use if necessary. This is not the only mode of use; in particular, the material in the appropriate chapter may be sufficient for a particular type of routine analysis. I have had the benefit of valuable advice from workers in various laboratories (Moscow State University, Moscow Steel Institute, the Institute of Crystallography, the Central Research Institute for Ferrous Metallurgy, the Technological Research Institute of the Automobile Industry, the Karpov Institute of Physical Chemistry, the All-Union Hard? Alloys K~search Institute, and so on). In addition, I am deeply indebted for much assistance to Professor Ya. S. Umanskii (scientific editor), Professor V. I. Iveronova, Professor A. I. Kitaigorodskii, G. A. Gol'der, and V. I. Rydnik. I recognize that this work cannot be free from deficiencies, and I should like to thank in advance workers in x-ray laboratories who may offer criticisms.The book is best used in the following sequence. (1) The radiation and method of recording are selected in accordance with the data of Chapters 1 and 2; the detailed param? eters for the recording are defined. (2) The patterns are indexed with the assistance of the graphs and tables of Chapter 3. (3) The measured intensities are compared with the values found from the tables of Chapter 4. (4) The particular problem at hand (determi? nation of stresses, phase analysis, and so on) is lÓ˝
Add Review