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Ion Tracks and Microtechnology Principles and Applications [Paperback]

$42.99     $54.99    22% Off      (Free Shipping)
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  • Category: Books (Technology & Engineering)
  • Author:  Spohr, Reimar
  • Author:  Spohr, Reimar
  • ISBN-10:  3322831043
  • ISBN-10:  3322831043
  • ISBN-13:  9783322831040
  • ISBN-13:  9783322831040
  • Publisher:  Vieweg+Teubner Verlag
  • Publisher:  Vieweg+Teubner Verlag
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Feb-2012
  • Pub Date:  01-Feb-2012
  • SKU:  3322831043-11-SPRI
  • SKU:  3322831043-11-SPRI
  • Item ID: 100810994
  • List Price: $54.99
  • Seller: ShopSpell
  • Ships in: 5 business days
  • Transit time: Up to 5 business days
  • Delivery by: Jul 04 to Jul 06
  • Notes: Brand New Book. Order Now.
I Principles of track creation.- 1 Irradiation technology.- 1.1 Radioactive sources.- 1.1.1 Nuclear reactors.- 1.1.2 Alpha and fission sources.- 1.2 Ion accelerators.- 1.2.1 Characteristic parameters of accelerators.- 1.2.2 Production of highly charged heavy ions.- 1.2.3 Ion deflection and focussing.- 1.2.4 Acceleration techniques.- 1.2.5 Behavior of ions at relativistic energies.- 1.3 Irradiation targets and equipment.- 1.3.1 Wide-beam irradiation devices.- 1.3.2 Scanning ion microbeams.- 1.4 Radiation safety.- 1.4.1 Handling of radioactive sources.- 1.4.2 Basics of sample activation by accelerated ions.- 2 Energy-loss phenomena.- 2.1 Energy-transfer to target electrons.- 2.1.1 Binary-encounter model.- 2.1.2 Impact parameter and scattering angle.- 2.1.3 Transferred kinetic energy.- 2.1.4 Energy-loss per unit length-of-path.- 2.1.5 Cut-off energy.- 2.1.6 Bohrs energy-loss relation.- 2.1.7 Charge-state of projectile-ion.- 2.1.8 Charge-corrected energy-loss relation.- 2.2 Secondary energy-loss effects.- 2.2.1 Energy-loss in multi-elemental targets.- 2.2.2 Energy-straggling and angular straggling.- 2.2.3 Energy-transfer to target nuclei.- 2.2.4 Calculation of ion range.- 3 Formation of the latent track.- 3.1 Track core  atomic defects.- 3.1.1 Coulomb explosion model.- 3.1.2 Atomic collision-cascade.- 3.1.3 Thermal-spike model.- 3.1.4 Resulting primary defects.- 3.1.5 Diffusion and relaxation of defects.- 3.2 Track halo  electronic defects.- 3.2.1 Electron emission from ion trajectory.- 3.2.2 Secondary-electron collision-cascade.- 3.2.3 Translation of deposited energy into effect.- 4 Development of ion tracks.- 4.1 Nucleation of a new phase.- 4.1.1 Origin of phases.- 4.1.2 Basic theory of interface energy.- 4.1.3 Condition for grain growth.- 4.1.4 Formation of condensation nuclei.- 4.2 Track response function.- 4.2.1 Track etch threshold.- 4.2.2 Track sensitization and annealing.- 4.3 Shape of etched tracks.- 4.3.1 Primary factors in track etching.- 4.3.2 Ficks firslc<
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