1. Apparatus and Method of Measuring Microhardness.- The PMT-3 Apparatus.- Determining the Scale of Microscope Magnification.- Adjusting and Calibrating the Apparatus.- Measuring the Diagonal of the Impression and Determining the Value of the Microhardness.- Some Special Cases of Using the Devices for Measuring Microhardness.- 2. Techniques of Determining Microhardness.- Evaluating the Object and Choosing the Point for Studying Microhardness.- Choice of Load.- Choice of Loading Time and Period under Load.- Measuring Microhardness with Automatic Sample Loading.- Effect of Vibrations on Microhardness.- Estimating Errors in Measuring Microhardness.- 3. Method of Preparing Samples for Study.- Effect of Structure.- Effect of the Particular State of the Surface Layer.- Chemical Treatment of the Surface of Microsections.- 4. Aspects of the Method of Measuring the Microhardness of Semiconductors.- Anisotropy of Microhardness.- Dislocation Density.- Microbrittleness.- 5. Relation between the Microhardness of Solid-Solution Crystals and the Composition of the Alloy in Two-Component Systems.- Theoretical Microhardness/Composition Relation in Two-Component Systems.- The Microhardness Method in Plotting Limited-Solubility Curves on Phase Diagrams of Two-Component Systems.- The Microhardness Method in Plotting Solidus Lines on the Phase Diagrams of Two-Component Systems.- Microhardness in Two-Component Semiconducting Systems.- Determining Ranges of Homogeneity Based on Semiconducting Compounds, Using the Microhardness Method.- Distribution of Alloying (Doping) Elements in the Production of Single Crystals.- Study of Diffusion Processes in Alloys.- 6. Use of the Microhardness Method in Studying the Phase Diagrams and Structure of Three-Component Alloys.- Some Theoretical Premises.- Construction of a Limited-Solubility Surface and a Solidus Surface.- Effect of the Deviations of the Sections Studied from the Conodes on the Character of the Microhardness/Composition Relationships.- Al£å