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Materials Characterization Techniques [Hardcover]

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  • Category: Books (Technology & Engineering)
  • Author:  Zhang, Sam
  • Author:  Zhang, Sam
  • ISBN-10:  1420042947
  • ISBN-10:  1420042947
  • ISBN-13:  9781420042948
  • ISBN-13:  9781420042948
  • Publisher:  Taylor & Francis
  • Publisher:  Taylor & Francis
  • Pages:  344
  • Pages:  344
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Jun-2008
  • Pub Date:  01-Jun-2008
  • SKU:  1420042947-11-MPOD
  • SKU:  1420042947-11-MPOD
  • Item ID: 101967895
  • Seller: ShopSpell
  • Ships in: 2 business days
  • Transit time: Up to 5 business days
  • Delivery by: Jan 20 to Jan 22
  • Notes: Brand New Book. Order Now.

Experts must be able to analyze and distinguish all materials, or combinations of materials, in use todaywhether they be metals, ceramics, polymers, semiconductors, or composites. To understand a materials structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researchers apply basic principles of chemistry, physics, and biology to address its scientific fundamentals, as well as how it is processed and engineered for use.

Emphasizing practical applications and real-world case studies, Materials Characterization Techniquespresents the principles of widely used, advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement.

This useful volume:

  • Explores scientific processes to characterize materials using modern technologies
  • Provides analysis of materials performance under specific use conditions
  • Focuses on the interrelationships and interdependence between processing, structure, properties, and performance
  • Details the sophisticated instruments involved in an interdisciplinary approach to understanding the wide range of mutually interacting processes, mechanisms, and materials
  • Covers electron, X-ray-photoelectron, and UV spectroscopy; scanning-electron, atomic-force, transmission-electron, and laser-confocal-scanning-florescent microscopy, and gel electrophoresis chromatography
  • Presents the fundamentals of vacuum, as well as X-ray diffraction principles

Explaining appropriate uses and related technical requirements for characterization techniques, the authors omit lengthy and often intimidating derivations and formulations. Instead, they emphasize useful basic principles and applications of modern techls9

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