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Long-Term Reliability of Nanometer VLSI Systems Modeling, Analysis and Optimiza [Paperback]

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Category: Books (Technology & Engineering)
Author: Tan, Sheldon, Tahoori, Mehdi, Kim, Taeyoung, Wang, Shengcheng, Sun, Zeyu, Kiamehr, Saman
Author: Tan, Sheldon, Tahoori, Mehdi, Kim, Taeyoung, Wang, Shengcheng, Sun, Zeyu, Kiamehr, Saman
ISBN-10: 3030261743
ISBN-10: 3030261743
ISBN-13: 9783030261740
ISBN-13: 9783030261740
Publisher: Springer
Publisher: Springer
Binding: Paperback
Binding: Paperback
Pub Date: 01-Apr-2020
Pub Date: 01-Apr-2020
SKU: 3030261743-11-SPRI
SKU: 3030261743-11-SPRI
Item ID: 105271305
List Price: $169.99