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Managing Temperature Effects in Nanoscale Adaptive Systems [Hardcover]

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  • Category: Books (Technology & Engineering)
  • Author:  Wolpert, David, Ampadu, Paul
  • Author:  Wolpert, David, Ampadu, Paul
  • ISBN-10:  1461407478
  • ISBN-10:  1461407478
  • ISBN-13:  9781461407478
  • ISBN-13:  9781461407478
  • Publisher:  Springer
  • Publisher:  Springer
  • Pages:  184
  • Pages:  184
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Apr-2011
  • Pub Date:  01-Apr-2011
  • SKU:  1461407478-11-SPRI
  • SKU:  1461407478-11-SPRI
  • Item ID: 100825702
  • List Price: $109.99
  • Seller: ShopSpell
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  • Delivery by: Jul 06 to Jul 08
  • Notes: Brand New Book. Order Now.

This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system reliability. A new method is presented to control a circuits temperature dependence by individually tuning pull-up and pull-down networks to their temperature-insensitive operating points. This method extends the range of supply voltages that can be made temperature-insensitive, achieving insensitivity at nominal voltage for the first time.

This book presents a variety of new techniques for detecting, controlling and exploiting the impact of temperature variations on nanoscale circuits and systems. Covers thermal-aware system design, management of temperature-induced faults, new sensors and more.

The Role of Temperature in Electronic Design.- Temperature Effects in Semiconductors.- Sensing Temperature Dependence.- Variation-Tolerant Adaptive Voltage Systems.- Controlling the Temperature Dependence.- Exploiting Temperature Dependence in Low-Swing Interconnect Links.- Avoiding Temperature-Induced Errors in On-Chip Interconnects.- Future Work and Open Problems.

This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems.? It provides a holistic discussion of temperature management, including physical phenomena (reversal of the MOSFET temperature dependence) that have recently become problematic, along with circuit techniques for detecting, controlling, and adapting to these phenomena. A detailed discussion is also included of the general aspects of thermal-aware system design and management of temperature-induced faults. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system relil3Ö

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