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Nanoscale Spectroscopy and Its Applications to Semiconductor Research [Paperback]

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  • Category: Books (Technology & Engineering)
  • ISBN-10:  3662143720
  • ISBN-10:  3662143720
  • ISBN-13:  9783662143728
  • ISBN-13:  9783662143728
  • Publisher:  Springer
  • Publisher:  Springer
  • Pages:  308
  • Pages:  308
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Feb-2013
  • Pub Date:  01-Feb-2013
  • SKU:  3662143720-11-SPRI
  • SKU:  3662143720-11-SPRI
  • Item ID: 100980158
  • List Price: $109.99
  • Seller: ShopSpell
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  • Delivery by: Jul 07 to Jul 09
  • Notes: Brand New Book. Order Now.
Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.Spectro-microscopy by TEM-SEM.- Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy.- Development of Cathodoluminescence (CL) for Semiconductor Research, Part I: TEM-CL Study of Microstructures and Defects in Semiconductor Epilayers.- Development of CL for Semiconductor Research, Part II: Cathodoluminescence Study of Semiconductor Nanoparticles and Nanostructures Using Low-Electron-Beam Energies.- Development of CL for Semiconductor Research, Part III: Study of Degradation Mechanisms in Compound Semiconductor-Based Devices by SEM-CL.- Microcharacterization of Conformal GaAs on Si Layers by Spatially Resolved Optical Techniques.- Strain Analysis in Submicron Electron Devices by Convergent Beam Electron Diffraction.- Syl#
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