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Robust Computing with Nano-scale Devices Progresses and Challenges [Hardcover]

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  • Category: Books (Technology & Engineering)
  • ISBN-10:  9048185394
  • ISBN-10:  9048185394
  • ISBN-13:  9789048185399
  • ISBN-13:  9789048185399
  • Publisher:  Springer
  • Publisher:  Springer
  • Pages:  180
  • Pages:  180
  • Binding:  Hardcover
  • Binding:  Hardcover
  • Pub Date:  01-Mar-2010
  • Pub Date:  01-Mar-2010
  • SKU:  9048185394-11-SPRI
  • SKU:  9048185394-11-SPRI
  • Item ID: 100988783
  • List Price: $109.99
  • Seller: ShopSpell
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Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.

The focus of this book is on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques.

Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.

Chapter 1: Introduction. Chapter 2: Fault Tolerant Nano-Computing; Bharat Joshi, Dhiraj K. Pradhan, and Saraju P. Mohanty. 2.1 Introduction. 2.2 Principles of Fault Tolerant Nano-Computer Systems. 2.3 Process Variations in Nano-scale Circuits. 2.4 Fault Tolerant Nano-Computer Applications. 2.5 Trends and Future. Chapter 3: Transistor-Level Based Defect-Tolerance for Reliable Nano-Electronics; Aiman H. El-Maleh, Bashir M. Al-Hashimi, Aissa Melouki, and Ahmad Al-Yamani. 3.1 Introduction. 3.2 Previous Approaches. 3.3 Proposed Defect Tolerance Technique. 3.4 Experimental Results. 3.5 Conclusion. Chapter 4: Fault-Tolerant Design for Nanol³"
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