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Signal Measurement and Estimation Techniques for Micro and Nanotechnology [Paperback]

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  • Category: Books (Technology & Engineering)
  • ISBN-10:  1489990399
  • ISBN-10:  1489990399
  • ISBN-13:  9781489990396
  • ISBN-13:  9781489990396
  • Publisher:  Springer
  • Publisher:  Springer
  • Binding:  Paperback
  • Binding:  Paperback
  • Pub Date:  01-Mar-2014
  • Pub Date:  01-Mar-2014
  • SKU:  1489990399-11-SPRI
  • SKU:  1489990399-11-SPRI
  • Item ID: 100883734
  • List Price: $109.99
  • Seller: ShopSpell
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  • Delivery by: Jul 05 to Jul 07
  • Notes: Brand New Book. Order Now.

<em>Signal Measurement and Estimation Techniques for Micro and Nanotechnology</em>? discusses micro, nano and robotic cells and gives a state-of-the-art? presentation of the different techniques and solutions to measure and estimate? signals at the micro and nano scale. New technologies and applications such as? micromanipulation (artificial components, biological objects), micro-assembly? (MEMS, MOEMS, NEMS) and material and surface force characterization are covered.? The importance of sensing at the micro and nano scale is presented as a key? issue in control systems, as well as for understanding the physical phenomena of? these systems. The book also: <ul>
??? <li>Explains issues that make signal measurement and estimation techniques? difficult at the micro-nano-scale and offers solutions</li>
??? <li>Discusses automated micro-assembly, and control of micro-nano robotic?devices</li>
??? <li>Presents and links signal measurement and estimation techniques for? micro-nano scale systems with microfabrication methods, sensors integration and? control schemes</li>
</ul>
<em>Signal Measurement and Estimation Techniques for Micro and? Nanotechnology</em> is a must-read for researchers and engineers working in MEMS and? control systems.

Covering micro-, nano- and robotic cells, this book presents the state of the art in a range of techniques to measure signals at the micro- and nanoscale. It covers new technologies such as micromanipulation, microassembly and surface force characterization.

Microscale Specificities.- Observer Techniques Applied to the Control of Piezoelectric Microactuators.- Measurement and Control for High-Speed Sub-Atomic Positioning in Scanning Probe Microscopes.- Microrobotic toolSC
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