This completely updated and revised second edition of
Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis.
Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.
List of Contributors xv
Preface xvii
1 Introduction 1
John C. Vickerman
1.1 How do we Define the Surface? 1
1.2 How Many Atoms in a Surface? 2
1.3 Information Required 3
1.4 Surface Sensitivity 5
1.5 Radiation Effects – Surface Damage 7
1.6 Complexity of the Data 8
2 Auger Electron Spectroscopy 9
Hans Jörg Mathieu
2.1 Introduction 9
2.2 Principle of the Auger Process 10
2.2.1 Kinetic Energies of Auger Peaks 11
2.2.2 Ionization Cross-Section 15
2.2.3 Comparison of Auger and Photon Emission 16
2.2.4 Electron Backscattering 17
2.2.5 Escape Depth 18
2.2.6 Chemical Shifts 19
2.3 Instrumentation 21
2.3.1 Electron Sources 22
2.3.2 Spectrometers 24
2.3.3 Modes of Acquisition 24
2.3.4 Detection Limits 29
2.3.5 Instrument Calibration 30