The present volume and its companion Volume 1 document the proceedings of the Symposium on Surface Contamination: Its Genesis, Detection and Control held in Washington, D.C., September 10-13, 1978. This Symposium was a part of the 4th International Symposium on Contamination Control held under the auspices of the International Committee of Contamination Control Societies, and the Institute of Environmental SciencesThe present volume and its companion Volume 1 document the proceedings of the Symposium on Surface Contamination: Its Genesis, Detection and Control held in Washington, D.C., September 10-13, 1978. This Symposium was a part of the 4th International Symposium on Contamination Control held under the auspices of the International Committee of Contamination Control Societies, and the Institute of Environmental Sciencesof Volume 2.- III. Surface Contamination Detection, Identification, Characterization, and Control.- Contamination Detection, Characterization, and Removal Based on Solubility Parameters.- Surface-Contamination Detection Through Wettability Measurements.- Microscopic Identification of Surface Contaminants.- Identification of Contaminants With Energetic Beam Techniques.- Applications of Auger Electron Spectroscopy to Characterize Contamination.- Auger and TEM Studies on the Contamination of Chemically Prepared GaAs Substrate Surfaces.- Surface Characterization of Contamination on Adhesive Bonding Materials.- Application of ISS/SIMS in Characterizing Thin Layers (?10nm) of Surface Contaminants.- Reduction of Contamination on Titanium Surfaces Studied by ESCA.- An ESCA Study of Surface Contaminants on Glass Substrates for Cell Adhesion.- An ESCA Analysis of Several Surface Cleaning Techniques.- Quantitative Techniques for Monitoring Surface Contamination.- Detection of Surface Contamination in Metal Bonding by Simple Methods.- Characterization of the Surface Quality by Means of Surface Potential Difference.- Applications of Ellipsometry for Monitorinl3%